doc. no : qw0905-LYG35162 rev. : a date : 16 - feb - 2005 data sheet ligitek electronics co.,ltd. property of ligitek only bipolar type led lamps LYG35162
2 1 0.5 typ 25.0min directivity radiation note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. -60 x 60 x 50% 100% 75% 25% 25% 0 75% 50% 100% -30 x 0 x 30 x 2.54typ 1 1.0min 2 part no. LYG35162 package dimensions page 1/5 7.01 1.76 1.5max y g 1.7 1.75 3.95 ligitek electronics co.,ltd. property of ligitek only
j -40 c ~ +100 c tstg storage temperature peak wave length f pnm viewing angle 2 c 1/2 (deg) note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. 565 585 gap green gaasp/gap LYG35162 white diffused yellow emitted lens 1.7 30 2.6 4.5 8.0 50 1.7 35 2.6 3.0 min. max. min. 8.0 50 typ. typical electrical & optical characteristics (ta=25 j ) material part no color luminous intensity @10ma(mcd) forward voltage @20ma(v) spectral halfwidth ??f nm soldering temperature tsol max 260 j for 5 sec max (2mm from body) page 2/5 part no. LYG35162 forward current i f ma 30 20 reverse current @5v operating temperature t opr ir peak forward current duty 1/10@10khz power dissipation pd i fp -40c ~ +85c 10 10 j g a 60 100 80 120 mw ma absolute maximum ratings absolute maximum ratings at ta=25 j parameter symbol g y unit ligitek electronics co.,ltd. property of ligitek only
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( j ) relative intensity@20ma wavelength (nm) forward voltage@20ma normalize @25 j fig.4 relative intensity vs. temperature ambient temperature( j ) relative intensity@20ma normalize @25 j typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage forward current(ma) forward current(ma) fig.2 relative intensity vs. forward current relative intensity normalize @20ma ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0 10 100 1000 0.0 0.5 1.0 1.5 2.0 2.5 3.0 -40 -20 0 20 40 60 1.0 1.1 1.2 500 550 600 650 0.0 0.5 1.0 2.0 3.0 4.0 5.0 80 100 0.8 0.9 -20 -40 40 20 080100 60 2.0 0.0 0.5 1.0 1.5 2.5 3.0 700 y chip part no. LYG35162 3/5 page
1.0 relative intensity@20ma 500 0.0 0.5 wavelength (nm) 650 550 600 -40 fig.5 relative intensity vs. wavelength fig.3 forward voltage vs. temperature forward voltage@20ma normalize @25 j 0.8 1.0 0.9 1.1 1.2 0.5 relative intensity@20ma normalize @25 j -40 60 ambient temperature( j ) 40 20 0 -20 100 80 0.0 ambient temperature( j ) 02040 -20 60 100 80 fig.4 relative intensity vs. temperature 2.5 1.5 1.0 2.0 3.0 1.0 fig.1 forward current vs. forward voltage typical electro-optical characteristics curve 100 forward current(ma) 0.1 10 1.0 1000 g chip relative intensity normalize @20ma 1.0 0.5 4.0 forward voltage(v) 2.0 3.0 5.0 0.0 1.5 1.0 2.0 100 forward current(ma) 10 1000 fig.2 relative intensity vs. forward current 2.5 3.0 ligitek electronics co.,ltd. property of ligitek only 3.5 part no. LYG35162 page4/5
this test intended to see soldering well performed or not. the purpose of this test is the resistance of the device under tropical for hous. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. solderability test 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec high temperature high humidity test thermal shock test solder resistance test the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. 1.ta=65 j? 5 j 2.rh=90 %~95 % 3.t=240hrs ? 2hrs mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202:103b jis c 7021: b-11 part no. LYG35162 page 5/5 this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) high temperature storage test low temperature storage test operating life test the purpose of this is the resistance of the device which is laid under ondition of hogh temperature for hours. 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) reliability test: test item test condition description mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 mil-std-883:1008 jis c 7021: b-10 jis c 7021: b-12 reference standard ligitek electronics co.,ltd. property of ligitek only
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